eS32
Category
Defect InspectionOverview
In February 2006, KLA introduced the latest addition to our eS3x series of e-beam inspection systems—the eS32. A single system spanning development and production applications, the eS32 provides the best sensitivity at throughput for defect types that optical systems cannot find.
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KLA
eS32
Defect InspectionVintage: Condition: Parts ToolLast VerifiedOver 60 days agoKLA
eS32
Defect InspectionVintage: 2006Condition: UsedLast VerifiedOver 60 days agoKLA
eS32
Defect InspectionVintage: 2006Condition: UsedLast VerifiedOver 60 days agoKLA
eS32
Defect InspectionVintage: Condition: UsedLast VerifiedOver 60 days ago