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KLA eDR-5210S
    Description
    REVIEW SEM
    Configuration
    No Configuration
    OEM Model Description
    The latest addition to the eDR-52xx series, the eDR-5210S e-beam wafer defect review system, introduces reticle defect review (RDR) and critical point inspection (CPI) modes, furthering the platform’s ability to identify systematic defects from various sources. The eDR-5210S also features improvements to its automated bare wafer (ABW) defect review mode. Upgradeable in the field from the eDR-5210, the new eDR-5210S is also available as a new defect review system.
    Documents

    No documents

    KLA

    eDR-5210S

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    78350

    Wafer Sizes:

    12"/300mm

    Vintage:

    2011

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    KLA eDR-5210S

    KLA

    eDR-5210S

    Defect Inspection
    Vintage: 2011Condition: Used
    Last VerifiedOver 60 days ago

    KLA

    eDR-5210S

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: Over 60 days ago
    listing-photo-b966eef5e3de4d8c9cbfff4fcfa097aa-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    78350

    Wafer Sizes:

    12"/300mm

    Vintage:

    2011

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    REVIEW SEM
    Configuration
    No Configuration
    OEM Model Description
    The latest addition to the eDR-52xx series, the eDR-5210S e-beam wafer defect review system, introduces reticle defect review (RDR) and critical point inspection (CPI) modes, furthering the platform’s ability to identify systematic defects from various sources. The eDR-5210S also features improvements to its automated bare wafer (ABW) defect review mode. Upgradeable in the field from the eDR-5210, the new eDR-5210S is also available as a new defect review system.
    Documents

    No documents

    Similar Listings
    View All
    KLA eDR-5210S

    KLA

    eDR-5210S

    Defect InspectionVintage: 2011Condition: UsedLast Verified:Over 60 days ago