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KLA eDR-5200
    Description
    Defect Review (SEM)
    Configuration
    2 LP+1 Chamber
    OEM Model Description
    The eDR-5200 features a lens system that delivers a significant improvement in resolution, meeting production and process development requirements for advanced design-rule semiconductor devices. Unique connectivity technology between the eDR-5200 and our market-leading inspection systems provides additional benefits to our customers with respect to defect redetection, classification and speed.
    Documents

    No documents

    KLA

    eDR-5200

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    62883

    Wafer Sizes:

    12"/300mm

    Vintage:

    2010

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
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    KLA eDR-5200

    KLA

    eDR-5200

    Defect Inspection
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago
    KLA eDR-5200

    KLA

    eDR-5200

    Defect Inspection
    Vintage: 2010Condition: Used
    Last VerifiedOver 60 days ago
    KLA eDR-5200

    KLA

    eDR-5200

    Defect Inspection
    Vintage: 2009Condition: Used
    Last VerifiedOver 60 days ago

    KLA

    eDR-5200

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: Over 60 days ago
    listing-photo-c75e19480f3e4fc4b9fb0ae491f14325-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1877/c75e19480f3e4fc4b9fb0ae491f14325/8a29d860b3174c76bcc9df27e7d6f2e9_7ca18d287664487cabc472162b390b0b45005c_mw.jpeg
    listing-photo-c75e19480f3e4fc4b9fb0ae491f14325-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1877/c75e19480f3e4fc4b9fb0ae491f14325/f879bebcd02f4981ac783198fe35367f_a558067385934a9e8a94afc42987b35d45005c_mw.jpeg
    listing-photo-c75e19480f3e4fc4b9fb0ae491f14325-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1877/c75e19480f3e4fc4b9fb0ae491f14325/287a4bc84c6a4c0b90e38dc481229bde_ccd676a56d84415d9d96f7d1db1ecf6c45005c_mw.jpeg
    listing-photo-c75e19480f3e4fc4b9fb0ae491f14325-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1877/c75e19480f3e4fc4b9fb0ae491f14325/98d237eb8c434c95ba906746ac6e73f1_2e5316baa0fd4530be9a34375f05d1e445005c_mw.jpeg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    62883

    Wafer Sizes:

    12"/300mm

    Vintage:

    2010

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Defect Review (SEM)
    Configuration
    2 LP+1 Chamber
    OEM Model Description
    The eDR-5200 features a lens system that delivers a significant improvement in resolution, meeting production and process development requirements for advanced design-rule semiconductor devices. Unique connectivity technology between the eDR-5200 and our market-leading inspection systems provides additional benefits to our customers with respect to defect redetection, classification and speed.
    Documents

    No documents

    Similar Listings
    View All
    KLA eDR-5200

    KLA

    eDR-5200

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago
    KLA eDR-5200

    KLA

    eDR-5200

    Defect InspectionVintage: 2010Condition: UsedLast Verified:Over 60 days ago
    KLA eDR-5200

    KLA

    eDR-5200

    Defect InspectionVintage: 2009Condition: UsedLast Verified:Over 60 days ago