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KLA eDR-5200
    Description
    Defect Review (SEM)
    Configuration
    2 LP+1 Chamber
    OEM Model Description
    The eDR-5200 features a lens system that delivers a significant improvement in resolution, meeting production and process development requirements for advanced design-rule semiconductor devices. Unique connectivity technology between the eDR-5200 and our market-leading inspection systems provides additional benefits to our customers with respect to defect redetection, classification and speed.
    Documents

    No documents

    KLA

    eDR-5200

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    62882

    Wafer Sizes:

    12"/300mm

    Vintage:

    2009

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
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    KLA eDR-5200

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    KLA eDR-5200

    KLA

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    Vintage: 2010Condition: Used
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    KLA eDR-5200

    KLA

    eDR-5200

    Defect Inspection
    Vintage: 2009Condition: Used
    Last VerifiedOver 60 days ago

    KLA

    eDR-5200

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: Over 60 days ago
    listing-photo-6864b0948be04bf3a4490a4aaeaad9cd-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1877/6864b0948be04bf3a4490a4aaeaad9cd/3178074a39ae4f3eaaa87d3ef17977c7_21d81e0164184896b1b8d7d7d76c829645005c_mw.jpeg
    listing-photo-6864b0948be04bf3a4490a4aaeaad9cd-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1877/6864b0948be04bf3a4490a4aaeaad9cd/4cfed168257548c496b47714986a241b_efe92774e93649c3818cb672ae2c54fb45005c_mw.jpeg
    listing-photo-6864b0948be04bf3a4490a4aaeaad9cd-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1877/6864b0948be04bf3a4490a4aaeaad9cd/3124724bae6947e3a0f894cad41c8b9a_536f737478db4d27a7abe24aa7540f3e45005c_mw.jpeg
    listing-photo-6864b0948be04bf3a4490a4aaeaad9cd-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1877/6864b0948be04bf3a4490a4aaeaad9cd/9c8f165451db44379202995861a7295a_247b9d43a087497d8b8a591fd195a13445005c_mw.jpeg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    62882

    Wafer Sizes:

    12"/300mm

    Vintage:

    2009

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Defect Review (SEM)
    Configuration
    2 LP+1 Chamber
    OEM Model Description
    The eDR-5200 features a lens system that delivers a significant improvement in resolution, meeting production and process development requirements for advanced design-rule semiconductor devices. Unique connectivity technology between the eDR-5200 and our market-leading inspection systems provides additional benefits to our customers with respect to defect redetection, classification and speed.
    Documents

    No documents

    Similar Listings
    View All
    KLA eDR-5200

    KLA

    eDR-5200

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago
    KLA eDR-5200

    KLA

    eDR-5200

    Defect InspectionVintage: 2010Condition: UsedLast Verified:Over 60 days ago
    KLA eDR-5200

    KLA

    eDR-5200

    Defect InspectionVintage: 2009Condition: UsedLast Verified:Over 60 days ago