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KLA CANDELA CS20v
  • KLA CANDELA CS20v
  • KLA CANDELA CS20v
  • KLA CANDELA CS20v
Description
No description
Configuration
No Configuration
OEM Model Description
The Candela CS20v is a highly sensitive inspection tool that can detect a wide variety of defects in substrates, epi layers, and film coatings. It can be used at multiple steps in the manufacturing process to provide immediate feedback. The tool generates detailed defect maps and reports, either through visual inspection or automated analysis. With a 25mW, 405nm violet laser, the CS20v offers an automated solution for inspecting products directly at multiple processing steps, eliminating the need for destructive testing and time-consuming manual inspection. This allows for improved quality control and increased efficiency in the manufacturing process.
Documents

No documents

PREFERRED
 
SELLER
CATEGORY
Defect Inspection

Last Verified: Over 60 days ago

Buyer pays 12% premium of final sale price
Key Item Details

Condition:

Used


Operational Status:

Unknown


Product ID:

112651


Wafer Sizes:

Unknown


Vintage:

Unknown


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
PREFERRED
 
SELLER

KLA

CANDELA CS20v

verified-listing-icon
Verified
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
listing-photo-ace139a3408f4c6e8d2bb839c69921e8-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
Buyer pays 12% premium of final sale price
Key Item Details

Condition:

Used


Operational Status:

Unknown


Product ID:

112651


Wafer Sizes:

Unknown


Vintage:

Unknown


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No description
Configuration
No Configuration
OEM Model Description
The Candela CS20v is a highly sensitive inspection tool that can detect a wide variety of defects in substrates, epi layers, and film coatings. It can be used at multiple steps in the manufacturing process to provide immediate feedback. The tool generates detailed defect maps and reports, either through visual inspection or automated analysis. With a 25mW, 405nm violet laser, the CS20v offers an automated solution for inspecting products directly at multiple processing steps, eliminating the need for destructive testing and time-consuming manual inspection. This allows for improved quality control and increased efficiency in the manufacturing process.
Documents

No documents