
Description
DEFECT INSPECTIONConfiguration
No ConfigurationOEM Model Description
The Candela CS20v is a highly sensitive inspection tool that can detect a wide variety of defects in substrates, epi layers, and film coatings. It can be used at multiple steps in the manufacturing process to provide immediate feedback. The tool generates detailed defect maps and reports, either through visual inspection or automated analysis. With a 25mW, 405nm violet laser, the CS20v offers an automated solution for inspecting products directly at multiple processing steps, eliminating the need for destructive testing and time-consuming manual inspection. This allows for improved quality control and increased efficiency in the manufacturing process.Documents
No documents
Verified
CATEGORY
Defect Inspection
Last Verified: 6 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
148246
Wafer Sizes:
2"/50mm, 4"/100mm, 6"/150mm, 8"/200mm
Vintage:
2012
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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CANDELA CS20v
CATEGORY
Defect Inspection
Last Verified: 6 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
148246
Wafer Sizes:
2"/50mm, 4"/100mm, 6"/150mm, 8"/200mm
Vintage:
2012
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
DEFECT INSPECTIONConfiguration
No ConfigurationOEM Model Description
The Candela CS20v is a highly sensitive inspection tool that can detect a wide variety of defects in substrates, epi layers, and film coatings. It can be used at multiple steps in the manufacturing process to provide immediate feedback. The tool generates detailed defect maps and reports, either through visual inspection or automated analysis. With a 25mW, 405nm violet laser, the CS20v offers an automated solution for inspecting products directly at multiple processing steps, eliminating the need for destructive testing and time-consuming manual inspection. This allows for improved quality control and increased efficiency in the manufacturing process.Documents
No documents