Description
Taken Offline in JulyConfiguration
6"OEM Model Description
The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool performance. It offers an integrated solution for automated defect classification and analysis, quickly turning defect data into yield-enhancing information. It is designed for flexibility in films, etch, photo, and CMP applications and offers advantages such as reducing process excursions, increasing overall equipment effectiveness, improving yield stability/predictability, and augmenting line monitoring.Documents
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KLA
AIT II
Verified
CATEGORY
Defect Inspection
Key Item Details
Condition:
Used
Operational Status:
Deinstalled
Product ID:
100099
Wafer Sizes:
6"/150mm
Vintage:
2000
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Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
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KLA
AIT II
Verified
CATEGORY
Defect Inspection
Last Verified: 11 days ago
Key Item Details
Condition:
Used
Operational Status:
Deinstalled
Product ID:
100099
Wafer Sizes:
6"/150mm
Vintage:
2000
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Taken Offline in JulyConfiguration
6"OEM Model Description
The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool performance. It offers an integrated solution for automated defect classification and analysis, quickly turning defect data into yield-enhancing information. It is designed for flexibility in films, etch, photo, and CMP applications and offers advantages such as reducing process excursions, increasing overall equipment effectiveness, improving yield stability/predictability, and augmenting line monitoring.Documents
No documents