AIT I
Category
Defect InspectionOverview
The AIT In-line Defect Inspection System is a high-throughput system that uses proprietary double-darkfield (DDF) laser scanning technology to detect defects, microscratches, and particulate contamination on wafers. It can inspect up to 30 wafers per hour at maximum sensitivity and has a low cost-per-inspection, making it economically feasible to perform in-line process monitoring at more process levels. The system achieves exceptional defect sensitivity through innovations such as a reduced laser spot size and a unique double-darkfield laser scattering design.
Active Listings
12
Services
Inspection, Insurance, Appraisal, Logistics
Top Listings
- AIT IDefect InspectionVintage: 1997Condition: UsedLast VerifiedOver 60 days ago
- AIT IDefect InspectionVintage: 1998Condition: UsedLast VerifiedOver 60 days ago
- AIT IDefect InspectionVintage: 1996Condition: UsedLast VerifiedOver 60 days ago
- AIT IDefect InspectionVintage: 1997Condition: UsedLast VerifiedOver 60 days ago
- AIT IDefect InspectionVintage: 2008Condition: RefurbishedLast VerifiedOver 60 days ago
- AIT IDefect InspectionVintage: Condition: UsedLast VerifiedOver 60 days ago
- AIT IDefect InspectionVintage: 1999Condition: UsedLast Verified21 days ago
- AIT IDefect InspectionVintage: Condition: UsedLast VerifiedOver 30 days ago