Description
SEM - Defect Review (DR)Configuration
No ConfigurationOEM Model Description
SEMVision™ is a powerful tool designed to be fully integrated into the defect reduction cycle for advanced production lines. It delivers high throughput and automated defect review using high-resolution scanning electron microscope (SEM) technology and imaging. This means that it can quickly and accurately identify and analyze defects in the production process, helping to improve the overall quality and efficiency of the production line.Documents
No documents
APPLIED MATERIALS (AMAT)
SEMVision
Verified
CATEGORY
Defect Inspection
Last Verified: 14 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
116358
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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APPLIED MATERIALS (AMAT)
SEMVision
CATEGORY
Defect Inspection
Last Verified: 14 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
116358
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
SEM - Defect Review (DR)Configuration
No ConfigurationOEM Model Description
SEMVision™ is a powerful tool designed to be fully integrated into the defect reduction cycle for advanced production lines. It delivers high throughput and automated defect review using high-resolution scanning electron microscope (SEM) technology and imaging. This means that it can quickly and accurately identify and analyze defects in the production process, helping to improve the overall quality and efficiency of the production line.Documents
No documents