Description
SEM REVIEW, CUConfiguration
SECS/GEM Capability • Factory Interface: o WIP Delivery: OHT o 25 wafer front opening unified pod (FOUP) carrier (2) • Review Station, SEM Review • 2nm physical resolution • Complete 3D data for superior defect visualization and classification • Analysis of defects as small as 30nm • Facilities Information: o OFA o Process Vacuum o Gases o Process Cooling Water o Ultra pure waterOEM Model Description
None ProvidedDocuments
No documents
APPLIED MATERIALS (AMAT)
SEMVISION GX
Verified
CATEGORY
Defect Inspection
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
73736
Wafer Sizes:
12"/300mm
Vintage:
Unknown
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Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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APPLIED MATERIALS (AMAT)
SEMVISION GX
Verified
CATEGORY
Defect Inspection
Last Verified: Over 30 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
73736
Wafer Sizes:
12"/300mm
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
SEM REVIEW, CUConfiguration
SECS/GEM Capability • Factory Interface: o WIP Delivery: OHT o 25 wafer front opening unified pod (FOUP) carrier (2) • Review Station, SEM Review • 2nm physical resolution • Complete 3D data for superior defect visualization and classification • Analysis of defects as small as 30nm • Facilities Information: o OFA o Process Vacuum o Gases o Process Cooling Water o Ultra pure waterOEM Model Description
None ProvidedDocuments
No documents
Similar Listings
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