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6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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APPLIED MATERIALS (AMAT) UVISION 200
    Description
    System has always been under full service contract and is in very good conditioning. Uvision SP 200 is a BF (Bright Field) wafer inspection tool It is designed to inspect pattern wafers, but it can also inspect bare and unpatterned wafers Ligth source: Laser ( ג= 266 nm) Tool scans a wafer in a meander path Die to Die ” and Cell to Cell ” comparison capability Can use reflected --( BrigthField ) and scattered signal (GF = GreyField ) in parallel for detection On pattern wafers capable of detecting defects of 25 nm with 90 % Capture Rate (Data from D&E recipe
    Configuration
    Uvision SP 200 is a BF (Bright Field) wafer inspection tool 200/300 mm capebiliity It is designed to inspect pattern wafers, but it can also inspect bare and unpatterned wafers Ligth source: Laser ( ג= 266 nm) Tool scans a wafer in a meander path Die to Die ” and Cell to Cell ” comparison capability Can use reflected --( BrigthField ) and scattered signal (GF = GreyField ) in parallel for detection On pattern wafers capable of detecting defects of 25 nm with 90 % Capture Rate (Data from D&E recipe,
    OEM Model Description
    None Provided
    Documents

    No documents

    APPLIED MATERIALS (AMAT)

    UVISION 200

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: Over 30 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Installed / Running


    Product ID:

    113572


    Wafer Sizes:

    12"/300mm


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    APPLIED MATERIALS (AMAT) UVISION 200

    APPLIED MATERIALS (AMAT)

    UVISION 200

    Defect Inspection
    Vintage: 2006Condition: Used
    Last VerifiedOver 60 days ago

    APPLIED MATERIALS (AMAT)

    UVISION 200

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: Over 30 days ago
    listing-photo-5bea7f55705c4ad5abbb43a73b2caae3-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Installed / Running


    Product ID:

    113572


    Wafer Sizes:

    12"/300mm


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    System has always been under full service contract and is in very good conditioning. Uvision SP 200 is a BF (Bright Field) wafer inspection tool It is designed to inspect pattern wafers, but it can also inspect bare and unpatterned wafers Ligth source: Laser ( ג= 266 nm) Tool scans a wafer in a meander path Die to Die ” and Cell to Cell ” comparison capability Can use reflected --( BrigthField ) and scattered signal (GF = GreyField ) in parallel for detection On pattern wafers capable of detecting defects of 25 nm with 90 % Capture Rate (Data from D&E recipe
    Configuration
    Uvision SP 200 is a BF (Bright Field) wafer inspection tool 200/300 mm capebiliity It is designed to inspect pattern wafers, but it can also inspect bare and unpatterned wafers Ligth source: Laser ( ג= 266 nm) Tool scans a wafer in a meander path Die to Die ” and Cell to Cell ” comparison capability Can use reflected --( BrigthField ) and scattered signal (GF = GreyField ) in parallel for detection On pattern wafers capable of detecting defects of 25 nm with 90 % Capture Rate (Data from D&E recipe,
    OEM Model Description
    None Provided
    Documents

    No documents

    Similar Listings
    View All
    APPLIED MATERIALS (AMAT) UVISION 200

    APPLIED MATERIALS (AMAT)

    UVISION 200

    Defect InspectionVintage: 2006Condition: UsedLast Verified:Over 60 days ago
    APPLIED MATERIALS (AMAT) UVISION 200

    APPLIED MATERIALS (AMAT)

    UVISION 200

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 30 days ago