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APPLIED MATERIALS (AMAT) SEMVISION G2
    Description
    Applied Materials SEMVision STAR Defect Analysis, Scanning Electron Microscope
    Configuration
    Inspection LD: 2ea, AsystInspection SEM
    OEM Model Description
    The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.
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    APPLIED MATERIALS (AMAT)

    SEMVISION G2

    verified-listing-icon

    Verified

    CATEGORY

    Defect Inspection
    Last Verified: 2 days ago
    Key Item Details
    Condition:

    Used

    Operational Status:

    Installed / Running

    Product ID:

    93121

    Wafer Sizes:

    Unknown

    Vintage:

    2002

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
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    Similar Listings
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    APPLIED MATERIALS (AMAT) SEMVISION G2
    APPLIED MATERIALS (AMAT)SEMVISION G2Defect Inspection
    Vintage: 2002Condition: Used
    Last Verified2 days ago

    APPLIED MATERIALS (AMAT)

    SEMVISION G2

    verified-listing-icon

    Verified

    CATEGORY

    Defect Inspection
    Last Verified: 2 days ago
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    Key Item Details
    Condition:

    Used

    Operational Status:

    Installed / Running

    Product ID:

    93121

    Wafer Sizes:

    Unknown

    Vintage:

    2002

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Applied Materials SEMVision STAR Defect Analysis, Scanning Electron Microscope
    Configuration
    Inspection LD: 2ea, AsystInspection SEM
    OEM Model Description
    The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.
    Documents

    No documents

    Similar Listings
    View All
    APPLIED MATERIALS (AMAT) SEMVISION G2
    APPLIED MATERIALS (AMAT)
    SEMVISION G2
    Defect InspectionVintage: 2002Condition: UsedLast Verified: 2 days ago