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APPLIED MATERIALS (AMAT) SEMVISION G2+
    Description
    Electron microscope No missing parts Current Wafer size : 12
    Configuration
    No Configuration
    OEM Model Description
    As part of the SEMVision G2 family, Applied SEMVision G2 Plus Defect Analysis system is the production-proven workhorse for inline defect review and analysis for the 65nm era. Continuing the productivity leadership of the SEMVision product line, G2 Plus delivers high throughput, extreme sensitivity and automated calibrations, offering the most advanced capabilities for production and engineering applications. Field proven applications such as High Aspect Ratio imaging, tilt imaging and material analysis provide customers the ability to control their defects and processes with greater success, leading to higher yields and faster time to market.
    Documents

    No documents

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    107079


    Wafer Sizes:

    8"/200mm, 12"/300mm


    Vintage:

    Unknown


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    APPLIED MATERIALS (AMAT) SEMVISION G2+

    APPLIED MATERIALS (AMAT)

    SEMVISION G2+

    Defect Inspection
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    APPLIED MATERIALS (AMAT)

    SEMVISION G2+

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: Over 60 days ago
    listing-photo-8cbfbee2053e4b6baa46cb06f32dcff4-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    107079


    Wafer Sizes:

    8"/200mm, 12"/300mm


    Vintage:

    Unknown


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Electron microscope No missing parts Current Wafer size : 12
    Configuration
    No Configuration
    OEM Model Description
    As part of the SEMVision G2 family, Applied SEMVision G2 Plus Defect Analysis system is the production-proven workhorse for inline defect review and analysis for the 65nm era. Continuing the productivity leadership of the SEMVision product line, G2 Plus delivers high throughput, extreme sensitivity and automated calibrations, offering the most advanced capabilities for production and engineering applications. Field proven applications such as High Aspect Ratio imaging, tilt imaging and material analysis provide customers the ability to control their defects and processes with greater success, leading to higher yields and faster time to market.
    Documents

    No documents

    Similar Listings
    View All
    APPLIED MATERIALS (AMAT) SEMVISION G2+

    APPLIED MATERIALS (AMAT)

    SEMVISION G2+

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago
    APPLIED MATERIALS (AMAT) SEMVISION G2+

    APPLIED MATERIALS (AMAT)

    SEMVISION G2+

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago