Applied Materials is committed to accelerating this new PPACt playbook for our customers and partners. We have the broadest and deepest portfolio of products for delivering PPACt innovations to the market. This portfolio encompasses the ability to create and deposit, shape and remove, modify, analyze, and connect materials and devices in new ways. We are unique in having a broad suite of process technology and metrology capabilities under one roof, and we have highly differentiated silicon and packaging lab capabilities. Our Integrated Materials Solutions co-optimize materials deposition, removal, modification, and analysis to create new materials and engineer new structures for high-performance, low-power chips at leading-edge nodes.

APPLIED MATERIALS (AMAT)

Applied ComPlus-EV Inspection is the industry's only patterned wafer inspection system that performs high-speed inspection of all darkfield and key brightfield applications for 90nm production. Using proprietary Enlarged GrayField technology, this single-system solution detects a broad range of defect types at production throughput, enabling faster ramp and higher production yield.

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OEM Model Description

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APPLIED MATERIALS (AMAT)

COMPLUS

Defect Inspection

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APPLIED MATERIALS (AMAT)

COMPLUS

APPLIED MATERIALS (AMAT)

COMPLUS

APPLIED MATERIALS (AMAT)

COMPLUS

APPLIED MATERIALS (AMAT)

COMPLUS

APPLIED MATERIALS (AMAT)

COMPLUS

COMPLUS

Defect Inspection

Key Item Details

Description

Configuration

OEM Model Description

Documents

Similar Listings

APPLIED MATERIALS (AMAT)

COMPLUS

APPLIED MATERIALS (AMAT)

COMPLUS

APPLIED MATERIALS (AMAT)

COMPLUS

APPLIED MATERIALS (AMAT)

COMPLUS

APPLIED MATERIALS (AMAT)

COMPLUS