COMPLUS
Category
Defect InspectionOverview
Applied ComPlus-EV Inspection is the industry's only patterned wafer inspection system that performs high-speed inspection of all darkfield and key brightfield applications for 90nm production. Using proprietary Enlarged GrayField technology, this single-system solution detects a broad range of defect types at production throughput, enabling faster ramp and higher production yield.
Active Listings
0
Services
Inspection, Insurance, Appraisal, Logistics