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6" Fab For Sale from Moov - Click Here to Learn More
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APPLIED MATERIALS (AMAT) COMPLUS MP
    Description
    Darkfield Inspection
    Configuration
    No Configuration
    OEM Model Description
    AMAT / APPLIED MATERIALS ComPlus MP is a wafer inspection system which can be used with 8" wafer sizes. The ComPlus-EV can be further enhanced with the MP (Multi-Perspective) option, which extends the system's exceptional capabilities to perform additional brightfield applications, including the detection of defects in the transistor area such as STI, gate, and tungsten plug layers. The MP option expands the number of detectors and magnifications, enabling higher sensitivity to flat defects at an increased capture rate, providing significantly higher throughput and reduced cost of ownership.
    Documents

    No documents

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: 18 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    83117


    Wafer Sizes:

    8"/200mm


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    APPLIED MATERIALS (AMAT) COMPLUS MP

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    Defect Inspection
    Vintage: 0Condition: Used
    Last Verified18 days ago

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: 18 days ago
    listing-photo-311c14888888489ea2197d7484daa27f-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    83117


    Wafer Sizes:

    8"/200mm


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Darkfield Inspection
    Configuration
    No Configuration
    OEM Model Description
    AMAT / APPLIED MATERIALS ComPlus MP is a wafer inspection system which can be used with 8" wafer sizes. The ComPlus-EV can be further enhanced with the MP (Multi-Perspective) option, which extends the system's exceptional capabilities to perform additional brightfield applications, including the detection of defects in the transistor area such as STI, gate, and tungsten plug layers. The MP option expands the number of detectors and magnifications, enabling higher sensitivity to flat defects at an increased capture rate, providing significantly higher throughput and reduced cost of ownership.
    Documents

    No documents

    Similar Listings
    View All
    APPLIED MATERIALS (AMAT) COMPLUS MP

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    Defect InspectionVintage: 0Condition: UsedLast Verified:18 days ago
    APPLIED MATERIALS (AMAT) COMPLUS MP

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    Defect InspectionVintage: 0Condition: UsedLast Verified:18 days ago
    APPLIED MATERIALS (AMAT) COMPLUS MP

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago