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APPLIED MATERIALS (AMAT) COMPLUS MP
    Description
    Darkfield Inspection
    Configuration
    No Configuration
    OEM Model Description
    AMAT / APPLIED MATERIALS ComPlus MP is a wafer inspection system which can be used with 8" wafer sizes. The ComPlus-EV can be further enhanced with the MP (Multi-Perspective) option, which extends the system's exceptional capabilities to perform additional brightfield applications, including the detection of defects in the transistor area such as STI, gate, and tungsten plug layers. The MP option expands the number of detectors and magnifications, enabling higher sensitivity to flat defects at an increased capture rate, providing significantly higher throughput and reduced cost of ownership.
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    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    verified-listing-icon

    Verified

    CATEGORY

    Defect Inspection
    Last Verified: Over 30 days ago
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    83117

    Wafer Sizes:

    8"/200mm

    Vintage:

    Unknown

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    Similar Listings
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    APPLIED MATERIALS (AMAT) COMPLUS MP
    APPLIED MATERIALS (AMAT)COMPLUS MPDefect Inspection
    Vintage: 0Condition: Used
    Last VerifiedOver 30 days ago
    APPLIED MATERIALS (AMAT) COMPLUS MP
    APPLIED MATERIALS (AMAT)COMPLUS MPDefect Inspection
    Vintage: 0Condition: Used
    Last VerifiedOver 30 days ago

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    verified-listing-icon

    Verified

    CATEGORY

    Defect Inspection
    Last Verified: Over 30 days ago
    listing-photo-311c14888888489ea2197d7484daa27f-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    83117

    Wafer Sizes:

    8"/200mm

    Vintage:

    Unknown

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Darkfield Inspection
    Configuration
    No Configuration
    OEM Model Description
    AMAT / APPLIED MATERIALS ComPlus MP is a wafer inspection system which can be used with 8" wafer sizes. The ComPlus-EV can be further enhanced with the MP (Multi-Perspective) option, which extends the system's exceptional capabilities to perform additional brightfield applications, including the detection of defects in the transistor area such as STI, gate, and tungsten plug layers. The MP option expands the number of detectors and magnifications, enabling higher sensitivity to flat defects at an increased capture rate, providing significantly higher throughput and reduced cost of ownership.
    Documents

    No documents

    Similar Listings
    View All
    APPLIED MATERIALS (AMAT) COMPLUS MP
    APPLIED MATERIALS (AMAT)
    COMPLUS MP
    Defect InspectionVintage: 0Condition: UsedLast Verified: Over 30 days ago
    APPLIED MATERIALS (AMAT) COMPLUS MP
    APPLIED MATERIALS (AMAT)
    COMPLUS MP
    Defect InspectionVintage: 0Condition: UsedLast Verified: Over 30 days ago