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APPLIED MATERIALS (AMAT) COMPASS 200
    Description
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    Configuration
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    OEM Model Description
    Applied Compass, a patterned wafer inspection systems designed for process monitoring down to the 100nm technology node. Critical defects are detected at production worthy throughput with OMNIView™, a multi-perspective laser scanning technology ensuring robust detection of a wide variety of defect types across all process layers. Compass is a high performance production tool and has the technology required for fast introduction of new technologies to volume production.
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    APPLIED MATERIALS (AMAT)

    COMPASS 200

    verified-listing-icon

    Verified

    CATEGORY

    Defect Inspection
    Last Verified: Over 30 days ago
    Key Item Details

    Condition:

    Parts Tool


    Operational Status:

    Unknown


    Product ID:

    100302


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown

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    verified-listing-icon

    Verified

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    Key Item Details

    Condition:

    Parts Tool


    Operational Status:

    Unknown


    Product ID:

    100302


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    Applied Compass, a patterned wafer inspection systems designed for process monitoring down to the 100nm technology node. Critical defects are detected at production worthy throughput with OMNIView™, a multi-perspective laser scanning technology ensuring robust detection of a wide variety of defect types across all process layers. Compass is a high performance production tool and has the technology required for fast introduction of new technologies to volume production.
    Documents

    No documents

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