COMPASS 200
Category
Defect InspectionOverview
Applied Compass, a patterned wafer inspection systems designed for process monitoring down to the 100nm technology node. Critical defects are detected at production worthy throughput with OMNIView™, a multi-perspective laser scanning technology ensuring robust detection of a wide variety of defect types across all process layers. Compass is a high performance production tool and has the technology required for fast introduction of new technologies to volume production.
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APPLIED MATERIALS (AMAT)
COMPASS 200
Defect InspectionVintage: 2000Condition: UsedLast VerifiedOver 60 days agoAPPLIED MATERIALS (AMAT)
COMPASS 200
Defect InspectionVintage: Condition: UsedLast VerifiedOver 60 days agoAPPLIED MATERIALS (AMAT)
COMPASS 200
Defect InspectionVintage: Condition: Parts ToolLast VerifiedOver 60 days agoAPPLIED MATERIALS (AMAT)
COMPASS 200
Defect InspectionVintage: 2001Condition: UsedLast VerifiedOver 60 days ago