Description
No descriptionConfiguration
-Configured for 8 inch (6" wafer sizes possible) -SW Version: 11 Options list: SECS Multipoint Measurement Hole Measurement Reduced Scan Image Database CP Controller Save to DOS FD IP Read Operator AccessoriesOEM Model Description
S-7840 review SEM has been incorporated with (1) ADR (automatic defect review) and ADC (automatic defect classification), (2) data interface with various inspection equipment, (3) an interface which transfers review results with SEM images showing the defects to an advanced data analysis system, and (4) defect sampling function which allows selection of type of defects for reviewing.Documents
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HITACHI
S-7840
Verified
CATEGORY
CD-SEM
Key Item Details
Condition:
Refurbished
Operational Status:
Unknown
Product ID:
54796
Wafer Sizes:
8"/200mm
Vintage:
2001
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Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
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HITACHI
S-7840
Verified
CATEGORY
CD-SEM
Last Verified: Over 30 days ago
Key Item Details
Condition:
Refurbished
Operational Status:
Unknown
Product ID:
54796
Wafer Sizes:
8"/200mm
Vintage:
2001
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
-Configured for 8 inch (6" wafer sizes possible) -SW Version: 11 Options list: SECS Multipoint Measurement Hole Measurement Reduced Scan Image Database CP Controller Save to DOS FD IP Read Operator AccessoriesOEM Model Description
S-7840 review SEM has been incorporated with (1) ADR (automatic defect review) and ADC (automatic defect classification), (2) data interface with various inspection equipment, (3) an interface which transfers review results with SEM images showing the defects to an advanced data analysis system, and (4) defect sampling function which allows selection of type of defects for reviewing.Documents
No documents