S-7840
Category
CD-SEMOverview
S-7840 review SEM has been incorporated with (1) ADR (automatic defect review) and ADC (automatic defect classification), (2) data interface with various inspection equipment, (3) an interface which transfers review results with SEM images showing the defects to an advanced data analysis system, and (4) defect sampling function which allows selection of type of defects for reviewing.
Active Listings
5
Services
Inspection, Insurance, Appraisal, Logistics
Top Listings
HITACHI
S-7840
CD-SEMVintage: Condition: UsedLast VerifiedOver 60 days agoHITACHI
S-7840
CD-SEMVintage: 2001Condition: RefurbishedLast VerifiedOver 60 days agoHITACHI
S-7840
CD-SEMVintage: 2001Condition: UsedLast VerifiedOver 60 days agoHITACHI
S-7840
CD-SEMVintage: Condition: UsedLast VerifiedOver 60 days ago
