Description
193nm (ArF) ScannerConfiguration
No ConfigurationOEM Model Description
NSR-S308F (resolution ≦ 65 nm). The NSR-308F has a newly developed platform that enables dramatic improvements in alignment accuracy and throughput. Alignment accuracy has been reduced to 8 nm or less, a 44% improvement over Nikon’s previous generation ArF scanner, while throughput was increased to 140 wafers or more per hour for 300 mm wafers, an improvement of approximately 25%. With this significant increase in productivity, the system delivers next-generation process capabilities at a lower overall cost of ownership.Documents
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NIKON
NSR-S308F
Verified
CATEGORY
193 nm Step and Scan
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
97536
Wafer Sizes:
12"/300mm
Vintage:
Unknown
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NIKON
NSR-S308F
Verified
CATEGORY
193 nm Step and Scan
Last Verified: 29 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
97536
Wafer Sizes:
12"/300mm
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
193nm (ArF) ScannerConfiguration
No ConfigurationOEM Model Description
NSR-S308F (resolution ≦ 65 nm). The NSR-308F has a newly developed platform that enables dramatic improvements in alignment accuracy and throughput. Alignment accuracy has been reduced to 8 nm or less, a 44% improvement over Nikon’s previous generation ArF scanner, while throughput was increased to 140 wafers or more per hour for 300 mm wafers, an improvement of approximately 25%. With this significant increase in productivity, the system delivers next-generation process capabilities at a lower overall cost of ownership.Documents
No documents