Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The FISCHERSCOPE® X-RAY XDV®-μ instruments are Fischer's high-end X-ray fluorescence series. They offer precise coating thickness measurement and material analysis on tiny structures. Equipped with powerful silicon drift detectors and polycapillary optics, they ensure quick and repeatable measurements with high radiation intensity. These instruments find applications in the electronics and semiconductor industry for measuring small structures like bond surfaces, SMD components, and thin wires. The XDV®-μ instruments feature a long-distance capillary for precise measurements on assembled PCBs and connectors. With a spacious measuring chamber, advanced polycapillary optics, and fast DPP+ digital pulse processor, they deliver accurate and efficient results.Documents
No documents
FISCHERSCOPE
XDVM-T7.1-W
Verified
CATEGORY
X-Ray
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
84342
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
FISCHERSCOPE
XDVM-T7.1-W
CATEGORY
X-Ray
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
84342
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The FISCHERSCOPE® X-RAY XDV®-μ instruments are Fischer's high-end X-ray fluorescence series. They offer precise coating thickness measurement and material analysis on tiny structures. Equipped with powerful silicon drift detectors and polycapillary optics, they ensure quick and repeatable measurements with high radiation intensity. These instruments find applications in the electronics and semiconductor industry for measuring small structures like bond surfaces, SMD components, and thin wires. The XDV®-μ instruments feature a long-distance capillary for precise measurements on assembled PCBs and connectors. With a spacious measuring chamber, advanced polycapillary optics, and fast DPP+ digital pulse processor, they deliver accurate and efficient results.Documents
No documents