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BRUKER D8 FABLINE
    Description
    XRAY DEFRACTION
    Configuration
    No Configuration
    OEM Model Description
    The D8 FABLINE provides fully automated handling of 300mm wafers . It provides a wide spectrum of techniques, such as rapid X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GID), and high-resolution X-ray diffraction (HR-XRD) in order to facilitate advanced process development and control on strained devices and high-K thin films, as well as materials characterization for future generation technology nodes.
    Documents

    No documents

    BRUKER

    D8 FABLINE

    verified-listing-icon

    Verified

    CATEGORY
    X-Ray

    Last Verified: Over 30 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    99051


    Wafer Sizes:

    12"/300mm


    Vintage:

    2014

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    Money Back Guarantee
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    Transaction Insured by Moov
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    BRUKER D8 FABLINE

    BRUKER

    D8 FABLINE

    X-Ray
    Vintage: 2015Condition: Used
    Last VerifiedOver 30 days ago

    BRUKER

    D8 FABLINE

    verified-listing-icon
    Verified
    CATEGORY
    X-Ray
    Last Verified: Over 30 days ago
    listing-photo-e634bcc24ec74150aff71e7fa4b35e7e-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    99051


    Wafer Sizes:

    12"/300mm


    Vintage:

    2014


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    XRAY DEFRACTION
    Configuration
    No Configuration
    OEM Model Description
    The D8 FABLINE provides fully automated handling of 300mm wafers . It provides a wide spectrum of techniques, such as rapid X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GID), and high-resolution X-ray diffraction (HR-XRD) in order to facilitate advanced process development and control on strained devices and high-K thin films, as well as materials characterization for future generation technology nodes.
    Documents

    No documents

    Similar Listings
    View All
    BRUKER D8 FABLINE

    BRUKER

    D8 FABLINE

    X-RayVintage: 2015Condition: UsedLast Verified: Over 30 days ago
    BRUKER D8 FABLINE

    BRUKER

    D8 FABLINE

    X-RayVintage: 2014Condition: UsedLast Verified: Over 60 days ago
    BRUKER D8 FABLINE

    BRUKER

    D8 FABLINE

    X-RayVintage: 2015Condition: UsedLast Verified: Over 60 days ago