Description
No descriptionConfiguration
No ConfigurationOEM Model Description
Automated X-ray defect inspection and metrology system designed for 300 mm silicon semiconductor wafersDocuments
No documents
Verified
CATEGORY
X-Ray / XRD / XRF
Last Verified: Yesterday
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
158707
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
BRUKER
JVsensus-600F
CATEGORY
X-Ray / XRD / XRF
Last Verified: Yesterday
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
158707
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
Automated X-ray defect inspection and metrology system designed for 300 mm silicon semiconductor wafersDocuments
No documents