Skip to main content
Moov logo

Moov Icon

JVsensus-600F

Overview

Automated X-ray defect inspection and metrology system designed for 300 mm silicon semiconductor wafers

Active Listings

0

Services

Inspection, Insurance, Appraisal, Logistics

Top Listings

    No products found
Have one like this?
List it with Moov and find the perfect buyer in no time at all.