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JEOL IB-19500CP
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The JEOL IB-19500CP is a Cross Section Polisher (CP) designed for preparing high-quality cross-sectional samples for electron microscopy. It utilizes a broad ion beam to mill specimens, producing clean, damage-free cross sections suitable for detailed analysis. This tool is particularly effective for materials that are challenging to prepare using traditional mechanical methods, including metals, polymers, ceramics, and composites.
    Documents

    No documents

    JEOL

    IB-19500CP

    verified-listing-icon

    Verified

    CATEGORY
    Wafer Polishing

    Last Verified: Yesterday

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    94976

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    JEOL IB-19500CP

    JEOL

    IB-19500CP

    Wafer Polishing
    Vintage: 0Condition: Used
    Last VerifiedYesterday

    JEOL

    IB-19500CP

    verified-listing-icon
    Verified
    CATEGORY
    Wafer Polishing
    Last Verified: Yesterday
    listing-photo-82f7eebac557445a9cd4a6e5415b9088-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    94976

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The JEOL IB-19500CP is a Cross Section Polisher (CP) designed for preparing high-quality cross-sectional samples for electron microscopy. It utilizes a broad ion beam to mill specimens, producing clean, damage-free cross sections suitable for detailed analysis. This tool is particularly effective for materials that are challenging to prepare using traditional mechanical methods, including metals, polymers, ceramics, and composites.
    Documents

    No documents

    Similar Listings
    View All
    JEOL IB-19500CP

    JEOL

    IB-19500CP

    Wafer PolishingVintage: 0Condition: UsedLast Verified:Yesterday