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IB-19500CP
Category
Wafer PolishingOverview
The JEOL IB-19500CP is a Cross Section Polisher (CP) designed for preparing high-quality cross-sectional samples for electron microscopy. It utilizes a broad ion beam to mill specimens, producing clean, damage-free cross sections suitable for detailed analysis. This tool is particularly effective for materials that are challenging to prepare using traditional mechanical methods, including metals, polymers, ceramics, and composites.
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