Description
Dimensions (without swivel desk) approx. 1 x 1 x 3 m Weight approx. 500 kgConfiguration
3 D - Surface and roughness measuring machine FRT, type MicroProf, year of construction 2007 with Table 310 x 310 mm Accessories: Optical sensor / video lens Chromatic sensor CWL F 6 mm Chromatic sensor CWL F 300 ym Double holder for 2 sensors Raised portal structure XY table 200 x 200 Housing PC with monitor and keyboardOEM Model Description
None ProvidedDocuments
No documents
FRT
MICROPROF
Verified
CATEGORY
Thin Film / Film Thickness
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
111725
Wafer Sizes:
Unknown
Vintage:
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
FRT
MICROPROF
CATEGORY
Thin Film / Film Thickness
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
111725
Wafer Sizes:
Unknown
Vintage:
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Dimensions (without swivel desk) approx. 1 x 1 x 3 m Weight approx. 500 kgConfiguration
3 D - Surface and roughness measuring machine FRT, type MicroProf, year of construction 2007 with Table 310 x 310 mm Accessories: Optical sensor / video lens Chromatic sensor CWL F 6 mm Chromatic sensor CWL F 300 ym Double holder for 2 sensors Raised portal structure XY table 200 x 200 Housing PC with monitor and keyboardOEM Model Description
None ProvidedDocuments
No documents