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ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8000XSE
    Description
    Film Thickness Measurement System
    Configuration
    No Configuration
    OEM Model Description
    The NanoSpec 8000XSE is a stand-alone, automated thin film measurement system that can handle wafers ranging in size from 75 to 200 millimeters in diameter. It includes a fully integrated spectroscopic ellipsometer for ultrathin and multiple film stack measurement applications. An FTIR option can be added to measure the thickness of epi-silicon. The 8000XSE also offers a standard mechanical interface with mini-environment enclosures for use in ultra-clean manufacturing facilities and can be configured to handle substrates used in the magnetic recording head industry.
    Documents

    No documents

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 8000XSE

    verified-listing-icon

    Verified

    CATEGORY
    Thin Film / Film Thickness

    Last Verified: 14 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    113811


    Wafer Sizes:

    6"/150mm


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8000XSE

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 8000XSE

    Thin Film / Film Thickness
    Vintage: 0Condition: Used
    Last Verified14 days ago

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 8000XSE

    verified-listing-icon
    Verified
    CATEGORY
    Thin Film / Film Thickness
    Last Verified: 14 days ago
    listing-photo-2b313bbf1775433cb09619e5e5c1a9ae-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    113811


    Wafer Sizes:

    6"/150mm


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Film Thickness Measurement System
    Configuration
    No Configuration
    OEM Model Description
    The NanoSpec 8000XSE is a stand-alone, automated thin film measurement system that can handle wafers ranging in size from 75 to 200 millimeters in diameter. It includes a fully integrated spectroscopic ellipsometer for ultrathin and multiple film stack measurement applications. An FTIR option can be added to measure the thickness of epi-silicon. The 8000XSE also offers a standard mechanical interface with mini-environment enclosures for use in ultra-clean manufacturing facilities and can be configured to handle substrates used in the magnetic recording head industry.
    Documents

    No documents

    Similar Listings
    View All
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8000XSE

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 8000XSE

    Thin Film / Film ThicknessVintage: 0Condition: UsedLast Verified:14 days ago
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8000XSE

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 8000XSE

    Thin Film / Film ThicknessVintage: 0Condition: UsedLast Verified:14 days ago
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8000XSE

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 8000XSE

    Thin Film / Film ThicknessVintage: 0Condition: Parts ToolLast Verified:Over 60 days ago