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KLA / ADE ULTRAGAGE 9500
  • KLA / ADE ULTRAGAGE 9500
  • KLA / ADE ULTRAGAGE 9500
  • KLA / ADE ULTRAGAGE 9500
Description
With ASC2000 controller
Configuration
No Configuration
OEM Model Description
The ADE 9500 UltraGage is a benchmark in wafer geometry characterization, essential in device fabrication and silicon wafer manufacturing. It accurately measures thickness, flatness, bow/warp, and more, using noncontact methods with 10nm resolution, applicable to both patterned and polished wafers. This compact tool offers nondestructive control, with options for manual or cassette operation, and supports optional networking including SECS/GEM. Ideal for applications in photolithography, CMP, and other processes, the UltraGage is a versatile, high-performance metrology solution.
Documents

No documents

PREFERRED
 
SELLER
CATEGORY
Thin Film / Film Thickness

Last Verified: 19 days ago

Buyer pays 12% premium of final sale price
Key Item Details

Condition:

Refurbished


Operational Status:

Unknown


Product ID:

124770


Wafer Sizes:

Unknown


Vintage:

Unknown


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
PREFERRED
 
SELLER

KLA / ADE

ULTRAGAGE 9500

verified-listing-icon
Verified
CATEGORY
Thin Film / Film Thickness
Last Verified: 19 days ago
listing-photo-1b70db51bb6a49258c790d4b7991c277-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
Buyer pays 12% premium of final sale price
Key Item Details

Condition:

Refurbished


Operational Status:

Unknown


Product ID:

124770


Wafer Sizes:

Unknown


Vintage:

Unknown


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
With ASC2000 controller
Configuration
No Configuration
OEM Model Description
The ADE 9500 UltraGage is a benchmark in wafer geometry characterization, essential in device fabrication and silicon wafer manufacturing. It accurately measures thickness, flatness, bow/warp, and more, using noncontact methods with 10nm resolution, applicable to both patterned and polished wafers. This compact tool offers nondestructive control, with options for manual or cassette operation, and supports optional networking including SECS/GEM. Ideal for applications in photolithography, CMP, and other processes, the UltraGage is a versatile, high-performance metrology solution.
Documents

No documents