
Description
FEI Titan 80-300 transmission electron microscope (TEM/STEM) utilizes aberration correction technology at its core, integrating multi-mode observation and in-situ analysis capabilities.Configuration
High Voltage Ranger: - 80 kV to 300 kV Convergent Beam Voltage Ranger: - 80 kV, 200 kV, 300 kV TEM: - At 300 kV voltage, resolution reaches up to 0.20 nm STEM Resolution: - At 300 kV voltage: 0.136 nm Camera Pixels: - GATAN Digital Camera: 2k×2k pixels - GATAN OneView IS CMOS Camera: 4k×4k pixelsOEM Model Description
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Verified
CATEGORY
TEM
Last Verified: 18 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
151846
Wafer Sizes:
Unknown
Vintage:
2009
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
FEI-TECNAI
Titan 80-300
CATEGORY
TEM
Last Verified: 18 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
151846
Wafer Sizes:
Unknown
Vintage:
2009
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
FEI Titan 80-300 transmission electron microscope (TEM/STEM) utilizes aberration correction technology at its core, integrating multi-mode observation and in-situ analysis capabilities.Configuration
High Voltage Ranger: - 80 kV to 300 kV Convergent Beam Voltage Ranger: - 80 kV, 200 kV, 300 kV TEM: - At 300 kV voltage, resolution reaches up to 0.20 nm STEM Resolution: - At 300 kV voltage: 0.136 nm Camera Pixels: - GATAN Digital Camera: 2k×2k pixels - GATAN OneView IS CMOS Camera: 4k×4k pixelsOEM Model Description
None ProvidedDocuments
No documents