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FEI-TECNAI Titan 80-300

Description

This single device is a classic flagship scientific research platform that integrates atomic-level imaging, light element analysis, 0.7 eV ultra-high energy resolution, and 1000°C in-situ heating, covering the full-dimensional characterization of "structure-composition-dynamic processes". Philips / FEI Titan 80-300 Transmission Electron Microscope

Configuration

Electron Gun Type: Schottky Field Emission Gun (S-FEG) Accelerating Voltage: 80 kV / 300 kV Dual Voltage Mode Objective Lens System: S-Twin lens with Image Corrector STEM-HAADF Resolution: 0.136 nm Detector: High-Angle Annular Dark-Field (HAADF) Detector CCD Camera: Gatan OneView EDS Spectrometer (EDAX Detector): - Energy Resolution: 136 eV ($\text{Mn-K}\alpha$) - Elemental Detection Range: Z=5 (Boron and heavier elements) EELS Spectrometer (GIF Tridiem 863): - Energy Resolution: 0.7 eV Solid Angle: 0.13 sr Sample Stage: Single-Tilt Holder / Fixture

OEM Model Description

None Provided

Documents

No documents

FEI-TECNAI

Titan 80-300

verified-listing-icon

Verified

CATEGORY

TEM

Last Verified: 17 days ago

Key Item Details

Condition:

Used

Operational Status:

Unknown

Product ID:

151851

Wafer Sizes:

Unknown

Vintage:

2006

Logistics Support

Available

Transaction Insured by Moov

Available

Refurbishment Services

Available

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listing-photo-fbd175f524af4e20ba128f3c28587c88-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/92672/fbd175f524af4e20ba128f3c28587c88/52b7c73f324d459dbf8a919b0c9c2ecd_da4cd50d037d403cb7a3bb3c01874b881201a_mw.jpeg

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Key Item Details

Condition:

Used

Operational Status:

Unknown

Product ID:

151851

Wafer Sizes:

Unknown

Vintage:

2006

Logistics Support

Available

Transaction Insured by Moov

Available

Refurbishment Services

Available

Description

This single device is a classic flagship scientific research platform that integrates atomic-level imaging, light element analysis, 0.7 eV ultra-high energy resolution, and 1000°C in-situ heating, covering the full-dimensional characterization of "structure-composition-dynamic processes". Philips / FEI Titan 80-300 Transmission Electron Microscope

Configuration

Electron Gun Type: Schottky Field Emission Gun (S-FEG) Accelerating Voltage: 80 kV / 300 kV Dual Voltage Mode Objective Lens System: S-Twin lens with Image Corrector STEM-HAADF Resolution: 0.136 nm Detector: High-Angle Annular Dark-Field (HAADF) Detector CCD Camera: Gatan OneView EDS Spectrometer (EDAX Detector): - Energy Resolution: 136 eV ($\text{Mn-K}\alpha$) - Elemental Detection Range: Z=5 (Boron and heavier elements) EELS Spectrometer (GIF Tridiem 863): - Energy Resolution: 0.7 eV Solid Angle: 0.13 sr Sample Stage: Single-Tilt Holder / Fixture

OEM Model Description

None Provided

Documents

No documents

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