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THERMOFISHER SCIENTIFIC / FEI / PHILIPS TECNAI G2 F30
    Description
    This is a field-emission gun Transmission Electron Microscope operable up to 300kV. The high-brightness, high coherency gun allow large electron probe currents to be focused onto nanometer sized areas of the specimen. High tilt capabilities (up to 70°) allow crystallography studies. It is equipped with an Electron Energy-Loss Gatan Imaging Filter to study low-Z elements. Images can be recorded using two different CCD cameras or film in TEM. Capabilities: Field Emission Gun Twin-pole piece with point to point resolution of 0.24nm; 0.15 nm resolution can be achieved by computer processing Magnifications up to 800,000X (More than 1 million times in STEM mode) Fully computer controlled high stability CompuStage Up to 70° eucentric tilt Operation at accelerating voltages from 50kV to 300kV 4k x 4k Ultrascan CCD camera Low-noise plate camera Bright Field (BF) and Dark Field (DF) STEM imaging High Angle Annular Dark Field (HAADF) detector for Z-Contrast imaging Gatan imaging filter with 2k x 2k CCD for Electron Energy Loss Spectrometry (EELS) and Energy Filtered imaging (EFTEM) Xplore 3D and Amira software for TEM Tomography (For 3D reconstruction of TEM images) Holders: Single-tilt holder Double-tilt holder Cryo-holder Tomography holder
    Configuration
    Specifications: Field Emission Gun Twin-pole piece with point to point resolution of 0.24nm; 0.15 nm resolution can be achieved by computer processing Magnifications up to 800,000X (More than 1 million times in STEM mode) Fully computer controlled high stability CompuStage Up to 70° eucentric tilt Operation at accelerating voltages from 50kV to 300kV 4k x 4k Ultrascan CCD camera Low-noise plate camera Bright Field (BF) and Dark Field (DF) STEM imaging High Angle Annular Dark Field (HAADF) detector for Z-Contrast imaging Gatan imaging filter with 2k x 2k CCD for Electron Energy Loss Spectrometry (EELS) and Energy Filtered imaging (EFTEM) Xplore 3D and Amira software for TEM Tomography (For 3D reconstruction of TEM images)
    OEM Model Description
    The Tecnal"' G2 F30 series are re11able and proven (scanning) transmission electron microscopes, with a unique and unrivalled task-orie-nted user Interface. The accessories that may be fitted to these systems have largely been embedded Into this user Interface, meaning that operators can utilize the full functionality of the total microscope system through one coherent Interface, allowing all the capabilities of the system to be easily controlled by operators of different experience levels.
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    verified-listing-icon

    Verified

    CATEGORY
    TEM

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    131555


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    THERMOFISHER SCIENTIFIC / FEI / PHILIPS TECNAI G2 F30

    THERMOFISHER SCIENTIFIC / FEI / PHILIPS

    TECNAI G2 F30

    TEM
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    THERMOFISHER SCIENTIFIC / FEI / PHILIPS

    TECNAI G2 F30

    verified-listing-icon
    Verified
    CATEGORY
    TEM
    Last Verified: Over 60 days ago
    listing-photo-bd740332eada49ccb6ecd0a20f64b795-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/87744/bd740332eada49ccb6ecd0a20f64b795/b1f03ee8f92e476d9395c416839d5315_a62e3eb9c6d243a3afd52b4e6b9f942345005c_mw.jpeg
    listing-photo-bd740332eada49ccb6ecd0a20f64b795-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/87744/bd740332eada49ccb6ecd0a20f64b795/a1138810ac6b42ea9665d6195c438452_c38a4571e2d64096bbb7e791bbfff72b45005c_mw.jpeg
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    131555


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    This is a field-emission gun Transmission Electron Microscope operable up to 300kV. The high-brightness, high coherency gun allow large electron probe currents to be focused onto nanometer sized areas of the specimen. High tilt capabilities (up to 70°) allow crystallography studies. It is equipped with an Electron Energy-Loss Gatan Imaging Filter to study low-Z elements. Images can be recorded using two different CCD cameras or film in TEM. Capabilities: Field Emission Gun Twin-pole piece with point to point resolution of 0.24nm; 0.15 nm resolution can be achieved by computer processing Magnifications up to 800,000X (More than 1 million times in STEM mode) Fully computer controlled high stability CompuStage Up to 70° eucentric tilt Operation at accelerating voltages from 50kV to 300kV 4k x 4k Ultrascan CCD camera Low-noise plate camera Bright Field (BF) and Dark Field (DF) STEM imaging High Angle Annular Dark Field (HAADF) detector for Z-Contrast imaging Gatan imaging filter with 2k x 2k CCD for Electron Energy Loss Spectrometry (EELS) and Energy Filtered imaging (EFTEM) Xplore 3D and Amira software for TEM Tomography (For 3D reconstruction of TEM images) Holders: Single-tilt holder Double-tilt holder Cryo-holder Tomography holder
    Configuration
    Specifications: Field Emission Gun Twin-pole piece with point to point resolution of 0.24nm; 0.15 nm resolution can be achieved by computer processing Magnifications up to 800,000X (More than 1 million times in STEM mode) Fully computer controlled high stability CompuStage Up to 70° eucentric tilt Operation at accelerating voltages from 50kV to 300kV 4k x 4k Ultrascan CCD camera Low-noise plate camera Bright Field (BF) and Dark Field (DF) STEM imaging High Angle Annular Dark Field (HAADF) detector for Z-Contrast imaging Gatan imaging filter with 2k x 2k CCD for Electron Energy Loss Spectrometry (EELS) and Energy Filtered imaging (EFTEM) Xplore 3D and Amira software for TEM Tomography (For 3D reconstruction of TEM images)
    OEM Model Description
    The Tecnal"' G2 F30 series are re11able and proven (scanning) transmission electron microscopes, with a unique and unrivalled task-orie-nted user Interface. The accessories that may be fitted to these systems have largely been embedded Into this user Interface, meaning that operators can utilize the full functionality of the total microscope system through one coherent Interface, allowing all the capabilities of the system to be easily controlled by operators of different experience levels.
    Documents

    No documents

    Similar Listings
    View All
    THERMOFISHER SCIENTIFIC / FEI / PHILIPS TECNAI G2 F30

    THERMOFISHER SCIENTIFIC / FEI / PHILIPS

    TECNAI G2 F30

    TEMVintage: 0Condition: UsedLast Verified:Over 60 days ago
    THERMOFISHER SCIENTIFIC / FEI / PHILIPS TECNAI G2 F30

    THERMOFISHER SCIENTIFIC / FEI / PHILIPS

    TECNAI G2 F30

    TEMVintage: 0Condition: UsedLast Verified:Over 60 days ago
    THERMOFISHER SCIENTIFIC / FEI / PHILIPS TECNAI G2 F30

    THERMOFISHER SCIENTIFIC / FEI / PHILIPS

    TECNAI G2 F30

    TEMVintage: 2005Condition: UsedLast Verified:Over 60 days ago