Thermo Fisher Scientific Inc. (NYSE: TMO), the world leader in serving science, today announced that it has completed its acquisition of FEI Company, Inc. (NASDAQ: FEIC), the leader in high-performance electron microscopy. FEI and Philips joined their technologies in 1993 to create the first DualBeam (FIB/SEM) workstation.

The Talos F200X G2 scanning transmission electron microscope ((S)TEM) delivers the most precise, quantitative characterization of nanomaterials in multiple dimensions. With innovative features designed to increase throughput, precision, and ease of use, the Talos F200X G2 (S)TEM is ideal for advanced research and analysis across academic, government, and industrial research environments.

THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

TALOS F200X G2

The ExSolve 2 WTP saves over 25% on TEM sample prep capital expense for leading electronics manufactures with a proprietary fast milling process and automation.

EXSOLVE 2 WTP

VECTRA+

The FEI V400ACE is a state-of-the-art Focused Ion Beam (FIB) system that integrates the most recent advancements in ion column technology, gas delivery, and end point detection. This allows for quick, efficient, and cost-effective circuit editing on advanced integrated circuits. With circuit editing, product designers can alter conductive pathways and test the changes within hours, instead of waiting weeks or months to create new masks and process new wafers. The V400ACE is specifically engineered to tackle the challenges posed by modern designs and processes, such as smaller geometries, higher circuit densities, new materials, and intricate interconnect structures. 

V400ACE

CM120 BioTwin

Equipped with cryo-shields for contamination-free observation, added liner-tube IGP and standard TMP on the airlock - Patented TWIN objective

TECNAI 20 TWIN

TECNAI 10

TECNAI G2 F20 U-TWIN

TECNAI G2 F20 X-TWIN

TECNAI G2 F30 TWIN

TECNAI G2 F20 TWIN

MORGAGNI

EX-SITU PLUCKER

TEMLINK 150

The FEI Tecnai TF-30 is a 300KV Transmission Electron Microscope (TEM) that is designed for the analysis of both hard and soft materials. It is capable of performing cryotomography on biological specimens, as well as TEM and tomography on hard materials. The system is equipped with high angle tomography, double-tilt and cryo holders, and can perform energy filtered TEM (EFTEM) and high angle annular dark field (HAADF) analysis. Additionally, the TF-30 features a Gatan K2 direct electron detector, which significantly improves contrast and resolution for both large and small molecules in cryo-electron microscopy.

TECNAI TF-30

S/TEM (scanning / transmission electron microscope)
High-throughput, multi-purpose TEM with low-distortion imaging

TALOS F200E

Philips 1970 model EM 201 was one of the simplified, easy-to-use TEMs on the market. The gun alignment was more automated, and the microscope stayed in focus despite changes in voltage and magnification.

EM-201

The Thermo Scientific Talos F200S (S)TEM is a (scanning) transmission electron microscope that combines outstanding high-resolution STEM and TEM imaging with industry-leading energy dispersive X-ray spectroscopy (EDS). The Talos F200S (S)TEM features great versatility and high through in STEM imaging and allows for precise EDS analysis and high-resolution TEM (HRTEM) for dynamic microscopy.

TALOS F200S G2

Philips 1972 model EM 301 TEM was designed for high performance and versatility for the skilled operator who had the time to coax the best results from his instrument. 

EM-301

TEMLINK - KY02, 14771-003

MORGAGNI 268

The image-corrected Titan G2 60-300 S/TEM provides superior performance, stability, and flexibility when utilizing the Cs image-corrector and electron monochromator technology for atomic resolution imaging and spectroscopy. The system provides flexibility of operating voltages at 60, 160 and 300 kV. Additionally, with the relatively wide pole piece gap of the S-TWIN lens, the Titan G2 60-300 is designed for dynamic experiments, with space around the sample area. 

TITAN G2 60-300

The EM 400 introduced in 1975 used a LAB6 electron gun, which was ten times as bright as the standard tungsten filament at the time. On the down side, the reactivity of lanthanum hexaboride required an ultra-clean vacuum system of 10-6 Torr.

EM-400

advanced analytical scanning/transmission electron microscope

THEMIS Z

TECNAI G2 F20 S-TWIN

TECNAI G2 F30 U-TWIN

The Thermo Scientific Talos F200i (S)TEM is a 20-200 kV field emission (scanning) transmission electron microscope uniquely designed for performance and productivity across a wide range of Materials Science samples and applications. Its standard X-Twin pole piece gap—giving the highest flexibility in applications—combined with a reproducibly performing electron column opens opportunities for high-resolution 2D and 3D characterization, in situ dynamic observations, and diffraction applications.

TALOS F200i

CM 100

The Tecnal"' G2 F30 series are re11able and proven (scanning) transmission electron microscopes, with a unique and unrivalled task-orie-nted user Interface. The accessories that may be fitted to these systems have largely been embedded Into this user Interface, meaning that operators can utilize the full functionality of the total microscope system through one coherent Interface, allowing all the capabilities of the system to be easily controlled by operators of different experience levels.

TECNAI G2 F30

The FEI Tecnai™ G2 F20 is a 200 kV scanning transmission electron microscope (S/TEM) that offers high performance, versatility, and productivity. It has a task-oriented user interface that runs on the Windows® XP operating system and is designed to be easy to use. The microscope can be fitted with various accessories such as STEM, CCD cameras, EDX and EELS detectors, and energy filters, which are all integrated into the user interface. This allows operators of different experience levels to fully utilize the functionality of the system through one coherent interface.

TECNAI G2 F20

TECNAI G2 F30 S-TWIN

CM120

CM10

V600

The FEI V600CE is a focused ion beam (FIB) system designed for fast, efficient, and cost-effective circuit editing on advanced integrated circuits at the 65 nm technology node and beyond. It incorporates the latest developments in ion column design, gas delivery, and end point detection. Circuit editing allows product designers to reroute conductive pathways and test modified circuits in hours, rather than the weeks or months required to generate new masks and process new wafers. This results in fewer, shorter modification and test cycles, allowing manufacturers to ramp up new processes faster and be first to market with premium-priced new products. The V600CE is specifically designed to meet the challenges of advanced designs and processes, including smaller geometries, higher circuit densities, exotic materials, and complex interconnect structures. It can also be configured for backside editing with an optional IR microscope and bulk silicon trenching package.

V600CE

CM200

TECNAI 20

CM 12

CM200 FEG microscope offers a unique combination of ultra high-resolution capabilities in TEM imaging, in scanning-imaging and in micro-analysis.

6" Fab For Sale from Moov - Click Here to Learn More

6" Fab For Sale from Moov - Click Here to Learn More

6" Fab For Sale from Moov - Click Here to Learn More

THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

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EXSOLVE 2 WTP

TALOS F200X G2

TECNAI TF-30

TALOS F200E

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