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ICP-MS With Collision Cell (EDR) - Operating system: ELAN DR II - Windows XPOEM Model Description
The ELAN DRC II combines the power of patented Dynamic Reaction Cell (DRC) technology, performance-enhancing Axial Field Technology (AFT) and a high-performance sample introduction system with the ability to run any reaction gas. The result is the ultimate analytical tool, providing uncompromised sensitivity and performance in all matrices for the world’s most difficult applications. Unlike collisioncell, high-resolution or cool-plasma systems, the ELAN DRC II completely eliminates polyatomic interferences, minimizing background equivalent concentrations, while maintaining analyte sensitivity, providing ultratrace-level detection limits in virtually any sample.Documents
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PERKIN ELMER
ELAN DRC II
Verified
CATEGORY
Spectrometer
Last Verified: Over 30 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
60579
Wafer Sizes:
Unknown
Vintage:
Unknown
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PERKIN ELMER
ELAN DRC II
CATEGORY
Spectrometer
Last Verified: Over 30 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
60579
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
ICP-MS With Collision Cell (EDR) - Operating system: ELAN DR II - Windows XPOEM Model Description
The ELAN DRC II combines the power of patented Dynamic Reaction Cell (DRC) technology, performance-enhancing Axial Field Technology (AFT) and a high-performance sample introduction system with the ability to run any reaction gas. The result is the ultimate analytical tool, providing uncompromised sensitivity and performance in all matrices for the world’s most difficult applications. Unlike collisioncell, high-resolution or cool-plasma systems, the ELAN DRC II completely eliminates polyatomic interferences, minimizing background equivalent concentrations, while maintaining analyte sensitivity, providing ultratrace-level detection limits in virtually any sample.Documents
No documents