FOCUS FE VII
Category
ElipsometryOverview
FOCUS FE VII system is designed for high volume, sub-micron device manufacturing requiring superior film thickness and index of refraction measurements in diffusion, etch, CMP and CVD applications.
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- FOCUS FE VIIElipsometryVintage: Condition: UsedLast VerifiedOver 30 days ago
- FOCUS FE VIIElipsometryVintage: 2002Condition: UsedLast VerifiedOver 60 days ago
- FOCUS FE VIIElipsometryVintage: 2002Condition: UsedLast VerifiedOver 60 days ago
- FOCUS FE VIIElipsometryVintage: Condition: UsedLast VerifiedOver 60 days ago