Description
No descriptionConfiguration
No ConfigurationOEM Model Description
SMI3050SE is an FIB-SEM hybrid system equipped with an ion beam optical system and electron beam optical system newly developed in response to the shrink of semiconductor devices, enabling high-precision sample processing and observation in comparison to conventional systems.Documents
No documents
SII NANOTECHNOLOGY / SEIKO
SMI3050SE
Verified
CATEGORY
SEM
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
97700
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
SII NANOTECHNOLOGY / SEIKO
SMI3050SE
CATEGORY
SEM
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
97700
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
SMI3050SE is an FIB-SEM hybrid system equipped with an ion beam optical system and electron beam optical system newly developed in response to the shrink of semiconductor devices, enabling high-precision sample processing and observation in comparison to conventional systems.Documents
No documents