Description
SEMConfiguration
JSM-6510LV EDS AMETEK EDAX Octane Pro Operation Keyboard Motor Controlled Stage(2 Axis)OEM Model Description
Introducing the JSM-6510LV Low Vacuum SEM: a high-performance, cost-effective scanning electron microscope. Ideal for fast characterization and imaging of fine structures, it belongs to a widely-used SEM family applicable in diverse research and industrial fields. Its selectable Low Vacuum mode enables observation of specimens with excessive water content or non-conductive surfaces. With a remarkable resolution of 3.0nm at 30kV, it offers exceptional clarity for precise measurements and 3D analysis. The SEM features dual live image display to contrast and compare specific details. Enhance your research further with optional elemental analysis using the energy dispersive X-ray spectrometer (EDS). Discover unparalleled imaging resolution, versatility, and ease of use with JSM-6510LV.Documents
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JEOL
JSM-6510LV
Verified
CATEGORY
SEM
Last Verified: 8 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
116074
Wafer Sizes:
Unknown
Vintage:
2014
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
JEOL
JSM-6510LV
CATEGORY
SEM
Last Verified: 8 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
116074
Wafer Sizes:
Unknown
Vintage:
2014
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
SEMConfiguration
JSM-6510LV EDS AMETEK EDAX Octane Pro Operation Keyboard Motor Controlled Stage(2 Axis)OEM Model Description
Introducing the JSM-6510LV Low Vacuum SEM: a high-performance, cost-effective scanning electron microscope. Ideal for fast characterization and imaging of fine structures, it belongs to a widely-used SEM family applicable in diverse research and industrial fields. Its selectable Low Vacuum mode enables observation of specimens with excessive water content or non-conductive surfaces. With a remarkable resolution of 3.0nm at 30kV, it offers exceptional clarity for precise measurements and 3D analysis. The SEM features dual live image display to contrast and compare specific details. Enhance your research further with optional elemental analysis using the energy dispersive X-ray spectrometer (EDS). Discover unparalleled imaging resolution, versatility, and ease of use with JSM-6510LV.Documents
No documents