Skip to main content
6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
Moov logo

6" Fab For Sale from Moov - Click Here to Learn More
Moov Icon
JEOL JSM 6400
    Description
    The gun alignment control electronics are currently in need of repair.
    Configuration
    Ultra thin window energy dispersive XPS Three WDS spectrometers Geller dSspec automation system controlling spectrometers Motorized Stage Imaging modes include secondary electrons, backscattered electrons and x-rays. Under ideal conditions, resolution in secondary electron imaging mode is 5 nm. Images can be recorded with Polaroid film and/or digital image capture through the Geller dPict module with subsequent output to a 1200 dpi laser printer. Characteristic x-rays can be detected from as little as a 1 cubic micrometer volume of the specimen. Elements from atomic number 5 (B) to 92 (U) can be detected in concentrations above 0.001 wt% element. Analysis modes include qualitative, standardless, and fully rigorous standards-based quantitative analysis. Additional capabilities of the Geller software package include analog and digital x-ray mapping and report generation. Both analog and digital x-ray or compositional mapping are available.
    OEM Model Description
    None Provided
    Documents

    No documents

    JEOL

    JSM 6400

    verified-listing-icon

    Verified

    CATEGORY
    SEM

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    63760


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    JEOL JSM 6400

    JEOL

    JSM 6400

    SEM
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    JEOL

    JSM 6400

    verified-listing-icon
    Verified
    CATEGORY
    SEM
    Last Verified: Over 60 days ago
    listing-photo-803a53db748f415bb564d8df6374124b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/51225/803a53db748f415bb564d8df6374124b/07f51024b4b04ccc95736e650ec6b100_64001_mw.jpeg
    listing-photo-803a53db748f415bb564d8df6374124b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/51225/803a53db748f415bb564d8df6374124b/eab644fc8573453d9d76f24994941e9e_angledviewstage_mw.jpeg
    listing-photo-803a53db748f415bb564d8df6374124b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/51225/803a53db748f415bb564d8df6374124b/dc07eb14a13240c5bea4810f426df399_owenscamera2006_mw.jpeg
    listing-photo-803a53db748f415bb564d8df6374124b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/51225/803a53db748f415bb564d8df6374124b/aa6eb98c6fe948f28acbb204ee725d5f_sempartofcrt_mw.jpeg
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    63760


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    The gun alignment control electronics are currently in need of repair.
    Configuration
    Ultra thin window energy dispersive XPS Three WDS spectrometers Geller dSspec automation system controlling spectrometers Motorized Stage Imaging modes include secondary electrons, backscattered electrons and x-rays. Under ideal conditions, resolution in secondary electron imaging mode is 5 nm. Images can be recorded with Polaroid film and/or digital image capture through the Geller dPict module with subsequent output to a 1200 dpi laser printer. Characteristic x-rays can be detected from as little as a 1 cubic micrometer volume of the specimen. Elements from atomic number 5 (B) to 92 (U) can be detected in concentrations above 0.001 wt% element. Analysis modes include qualitative, standardless, and fully rigorous standards-based quantitative analysis. Additional capabilities of the Geller software package include analog and digital x-ray mapping and report generation. Both analog and digital x-ray or compositional mapping are available.
    OEM Model Description
    None Provided
    Documents

    No documents

    Similar Listings
    View All
    JEOL JSM 6400

    JEOL

    JSM 6400

    SEMVintage: 0Condition: UsedLast Verified:Over 60 days ago
    JEOL JSM 6400

    JEOL

    JSM 6400

    SEMVintage: 0Condition: UsedLast Verified:Over 60 days ago
    JEOL JSM 6400

    JEOL

    JSM 6400

    SEMVintage: 0Condition: UsedLast Verified:Over 60 days ago