Description
No descriptionConfiguration
-Resolution: 1,8 nm at 1kV or 0,5 nm at 30kV -Magnification: Low magnification mode: 60 to 10k x (accuracy ± 10%) High magnification mode: 800 to 2,000k x (accuracy ± 10%) -Electron source: Cold-cathode field emission type electron source -STEM option: brightfield /darkfield STEM Detector, STEM sample holder -EDX X-MAX 80 (2012) AZtec EDX Software Advanced -Point electronic DISS5 (2012) -Hitachi ZONE-TEM Desktop Sample Cleaner (2014) power is 200/208/230 VAC, Single Phase, 50/60 Hz, 4 kVAOEM Model Description
None ProvidedDocuments
No documents
HITACHI
S-5200
Verified
CATEGORY
SEM
Key Item Details
Condition:
Used
Operational Status:
Installed / Running
Product ID:
96224
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Similar Listings
View AllHITACHI
S-5200
Verified
CATEGORY
SEM
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Installed / Running
Product ID:
96224
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
-Resolution: 1,8 nm at 1kV or 0,5 nm at 30kV -Magnification: Low magnification mode: 60 to 10k x (accuracy ± 10%) High magnification mode: 800 to 2,000k x (accuracy ± 10%) -Electron source: Cold-cathode field emission type electron source -STEM option: brightfield /darkfield STEM Detector, STEM sample holder -EDX X-MAX 80 (2012) AZtec EDX Software Advanced -Point electronic DISS5 (2012) -Hitachi ZONE-TEM Desktop Sample Cleaner (2014) power is 200/208/230 VAC, Single Phase, 50/60 Hz, 4 kVAOEM Model Description
None ProvidedDocuments
No documents