Description
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With EDX Secondary electron image resolution: 1.0nm (15kV, WD=4mm) 1.4nm (1kV, WD=1.5mm, Deceleration mode) 2.0nm (1kV, WD-1.5mm, Normal mode) Magnification: LM mode: 20 ~ 2,000X HM mode: 100 ~ 800,000X Specimen Stage: Stage Motorization: 5 Axis Stage Motorization Type II: X: 0 ~ 110mm; Y: 0 ~ 110mm, Z: 1.5 ~ 40mm; T: -5 ~ +70 deg, R: 360 deg Configuration: Operating System: Windows XP (Windows 10 upgrade as an option) Turbo Pump Joy Stick stage control Decleration mode RS-232C Option: IXRF EDXOEM Model Description
Field Emission Scanning Electron MicroscopeDocuments
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HITACHI
S-4800 II
Verified
CATEGORY
SEM
Key Item Details
Condition:
Refurbished
Operational Status:
Unknown
Product ID:
74435
Wafer Sizes:
Unknown
Vintage:
Unknown
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Logistics Support
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Refurbishment Services
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HITACHI
S-4800 II
Verified
CATEGORY
SEM
Last Verified: Over 60 days ago
Key Item Details
Condition:
Refurbished
Operational Status:
Unknown
Product ID:
74435
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
With EDX Secondary electron image resolution: 1.0nm (15kV, WD=4mm) 1.4nm (1kV, WD=1.5mm, Deceleration mode) 2.0nm (1kV, WD-1.5mm, Normal mode) Magnification: LM mode: 20 ~ 2,000X HM mode: 100 ~ 800,000X Specimen Stage: Stage Motorization: 5 Axis Stage Motorization Type II: X: 0 ~ 110mm; Y: 0 ~ 110mm, Z: 1.5 ~ 40mm; T: -5 ~ +70 deg, R: 360 deg Configuration: Operating System: Windows XP (Windows 10 upgrade as an option) Turbo Pump Joy Stick stage control Decleration mode RS-232C Option: IXRF EDXOEM Model Description
Field Emission Scanning Electron MicroscopeDocuments
No documents