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HITACHI S-4700 I
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The S-4700 Type I is a cutting-edge electron microscope with remarkable features. It offers high-resolution imaging at low accelerating voltages, ensuring a guaranteed resolution of 2.1 nm at 1 kV. Routine microscopy is made convenient with a long working distance of 12 mm, allowing sample exchange via an airlock without the need for repositioning. At 15 kV, the microscope maintains a high resolution of 1.5 nm. Additionally, it enables a sample tilt of 45 degrees without altering the working distance and offers a high X-ray take-off angle of 30 degrees with the sample normal to the beam. The instrument boasts an integrated electron detector for both secondary electrons (SE) and backscattered electrons (BSE), allowing operators to choose the best imaging mode for their samples. With complete column setup controlled through a computer interface, users can effortlessly switch between ultra-high-resolution mode and analysis mode. The unique objective lens design permits simultaneous use of YAG-type BSE and EDX detectors, enhancing imaging versatility.
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    HITACHI

    S-4700 I

    verified-listing-icon

    Verified

    CATEGORY
    SEM

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    104040


    Wafer Sizes:

    Unknown


    Vintage:

    2002


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    HITACHI S-4700 I

    HITACHI

    S-4700 I

    SEM
    Vintage: 2001Condition: Used
    Last VerifiedOver 60 days ago

    HITACHI

    S-4700 I

    verified-listing-icon
    Verified
    CATEGORY
    SEM
    Last Verified: Over 60 days ago
    listing-photo-c9f9fb11c3d64cef827763a4ee047cf1-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1554/c9f9fb11c3d64cef827763a4ee047cf1/6667bce67b8a4ef6baff8431891dad6c_140fd0d9208a48bd919a19e736ca60511201a_mw.jpeg
    listing-photo-c9f9fb11c3d64cef827763a4ee047cf1-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1554/c9f9fb11c3d64cef827763a4ee047cf1/316df38601b94b56924986c3a6346ab0_156c2b3162e54c3296ec7af9736bb3c11201a_mw.jpeg
    listing-photo-c9f9fb11c3d64cef827763a4ee047cf1-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1554/c9f9fb11c3d64cef827763a4ee047cf1/b09e1a8e27f446fc86e022d0f3992319_fcb6f3398b064dc9a056f244131966211201a_mw.jpeg
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    104040


    Wafer Sizes:

    Unknown


    Vintage:

    2002


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The S-4700 Type I is a cutting-edge electron microscope with remarkable features. It offers high-resolution imaging at low accelerating voltages, ensuring a guaranteed resolution of 2.1 nm at 1 kV. Routine microscopy is made convenient with a long working distance of 12 mm, allowing sample exchange via an airlock without the need for repositioning. At 15 kV, the microscope maintains a high resolution of 1.5 nm. Additionally, it enables a sample tilt of 45 degrees without altering the working distance and offers a high X-ray take-off angle of 30 degrees with the sample normal to the beam. The instrument boasts an integrated electron detector for both secondary electrons (SE) and backscattered electrons (BSE), allowing operators to choose the best imaging mode for their samples. With complete column setup controlled through a computer interface, users can effortlessly switch between ultra-high-resolution mode and analysis mode. The unique objective lens design permits simultaneous use of YAG-type BSE and EDX detectors, enhancing imaging versatility.
    Documents

    No documents

    Similar Listings
    View All
    HITACHI S-4700 I

    HITACHI

    S-4700 I

    SEMVintage: 2001Condition: UsedLast Verified:Over 60 days ago
    HITACHI S-4700 I

    HITACHI

    S-4700 I

    SEMVintage: 0Condition: UsedLast Verified:Over 60 days ago
    HITACHI S-4700 I

    HITACHI

    S-4700 I

    SEMVintage: 2011Condition: UsedLast Verified:Over 60 days ago