![HITACHI S-3700N](https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-large.png)
Description
SEMConfiguration
SEM, Large sample chamber (maximum 300mm diameter), 5-axis MD, Camera navigation, Secondary electron/Reflective electron, Low- vacuum secondary electron detector ESED-II, EDX HORIBA EMAX Evolution X Max50 EX470OEM Model Description
S-3700N is designed as a new series of Tungsten-type VP-SEM to accommodate sample diameters up to 300mm using a new large specimen chamber and a large specimen stage. Moreover, simultaneous accommodations of accessory attachments for EDX, WDX and EBSP (*1) analyses are possible at optimized analytical geometry. The specimen stage has a wide traverse range for observation of sample areas up to 203mm diameter and up to 110mm height with EDX and WDX analysis.Documents
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HITACHI
S-3700N
Verified
CATEGORY
SEM
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
109047
Wafer Sizes:
Unknown
Vintage:
2017
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
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View AllHITACHI
S-3700N
CATEGORY
SEM
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
109047
Wafer Sizes:
Unknown
Vintage:
2017
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
SEMConfiguration
SEM, Large sample chamber (maximum 300mm diameter), 5-axis MD, Camera navigation, Secondary electron/Reflective electron, Low- vacuum secondary electron detector ESED-II, EDX HORIBA EMAX Evolution X Max50 EX470OEM Model Description
S-3700N is designed as a new series of Tungsten-type VP-SEM to accommodate sample diameters up to 300mm using a new large specimen chamber and a large specimen stage. Moreover, simultaneous accommodations of accessory attachments for EDX, WDX and EBSP (*1) analyses are possible at optimized analytical geometry. The specimen stage has a wide traverse range for observation of sample areas up to 203mm diameter and up to 110mm height with EDX and WDX analysis.Documents
No documents