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6" Fab For Sale from Moov - Click Here to Learn More
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HITACHI S-3700N
    Description
    SEM
    Configuration
    SEM, Large sample chamber (maximum 300mm diameter), 5-axis MD, Camera navigation, Secondary electron/Reflective electron, Low- vacuum secondary electron detector ESED-II, EDX HORIBA EMAX Evolution X Max50 EX470
    OEM Model Description
    S-3700N is designed as a new series of Tungsten-type VP-SEM to accommodate sample diameters up to 300mm using a new large specimen chamber and a large specimen stage. Moreover, simultaneous accommodations of accessory attachments for EDX, WDX and EBSP (*1) analyses are possible at optimized analytical geometry. The specimen stage has a wide traverse range for observation of sample areas up to 203mm diameter and up to 110mm height with EDX and WDX analysis.
    Documents

    No documents

    HITACHI

    S-3700N

    verified-listing-icon

    Verified

    CATEGORY
    SEM

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    109047


    Wafer Sizes:

    Unknown


    Vintage:

    2017


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    HITACHI S-3700N

    HITACHI

    S-3700N

    SEM
    Vintage: 2012Condition: Used
    Last VerifiedOver 60 days ago

    HITACHI

    S-3700N

    verified-listing-icon
    Verified
    CATEGORY
    SEM
    Last Verified: Over 60 days ago
    listing-photo-7bc7aab59a6b4fe9ab0865f7ea4fd72f-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    109047


    Wafer Sizes:

    Unknown


    Vintage:

    2017


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    SEM
    Configuration
    SEM, Large sample chamber (maximum 300mm diameter), 5-axis MD, Camera navigation, Secondary electron/Reflective electron, Low- vacuum secondary electron detector ESED-II, EDX HORIBA EMAX Evolution X Max50 EX470
    OEM Model Description
    S-3700N is designed as a new series of Tungsten-type VP-SEM to accommodate sample diameters up to 300mm using a new large specimen chamber and a large specimen stage. Moreover, simultaneous accommodations of accessory attachments for EDX, WDX and EBSP (*1) analyses are possible at optimized analytical geometry. The specimen stage has a wide traverse range for observation of sample areas up to 203mm diameter and up to 110mm height with EDX and WDX analysis.
    Documents

    No documents

    Similar Listings
    View All
    HITACHI S-3700N

    HITACHI

    S-3700N

    SEMVintage: 2012Condition: UsedLast Verified:Over 60 days ago
    HITACHI S-3700N

    HITACHI

    S-3700N

    SEMVintage: 0Condition: UsedLast Verified:8 days ago
    HITACHI S-3700N

    HITACHI

    S-3700N

    SEMVintage: 2017Condition: UsedLast Verified:Over 60 days ago