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HITACHI S-3700N
    Description
    No description
    Configuration
    SEM, Large sample chamber (maximum 300mm diameter), 5-axis MD, Camera navigation, Secondary electron/Reflective electron, Low- vacuum secondary electron detector ESED-II, EDX HORIBA EMAX Evolution X Max50 EX470
    OEM Model Description
    S-3700N is designed as a new series of Tungsten-type VP-SEM to accommodate sample diameters up to 300mm using a new large specimen chamber and a large specimen stage. Moreover, simultaneous accommodations of accessory attachments for EDX, WDX and EBSP (*1) analyses are possible at optimized analytical geometry. The specimen stage has a wide traverse range for observation of sample areas up to 203mm diameter and up to 110mm height with EDX and WDX analysis.
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    HITACHI

    S-3700N

    verified-listing-icon

    Verified

    CATEGORY

    SEM
    Last Verified: 30 days ago
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    99983

    Wafer Sizes:

    Unknown

    Vintage:

    2017

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    Money Back Guarantee
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    Transaction Insured by Moov
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    HITACHI

    S-3700N

    verified-listing-icon

    Verified

    CATEGORY

    SEM
    Last Verified: 30 days ago
    listing-photo-27eb390dbd884dfeb1c9bf1d018fc1a6-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    99983

    Wafer Sizes:

    Unknown

    Vintage:

    2017

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    SEM, Large sample chamber (maximum 300mm diameter), 5-axis MD, Camera navigation, Secondary electron/Reflective electron, Low- vacuum secondary electron detector ESED-II, EDX HORIBA EMAX Evolution X Max50 EX470
    OEM Model Description
    S-3700N is designed as a new series of Tungsten-type VP-SEM to accommodate sample diameters up to 300mm using a new large specimen chamber and a large specimen stage. Moreover, simultaneous accommodations of accessory attachments for EDX, WDX and EBSP (*1) analyses are possible at optimized analytical geometry. The specimen stage has a wide traverse range for observation of sample areas up to 203mm diameter and up to 110mm height with EDX and WDX analysis.
    Documents

    No documents

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    View All
    HITACHI S-3700N
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