Skip to main content
Moov logo
Moov Icon
HITACHI S-3700N
    Description
    No description
    Configuration
    - EDS: Yes EDAX/ Model: Apollo XP Detectors: - Everhart thornley secondary electron detector - High sensitivity semiconductor BSE detector OS：SEM/Windows 7, EDX/Windows7 Accessories: Carbon Coater (VC-100)
    OEM Model Description
    S-3700N is designed as a new series of Tungsten-type VP-SEM to accommodate sample diameters up to 300mm using a new large specimen chamber and a large specimen stage. Moreover, simultaneous accommodations of accessory attachments for EDX, WDX and EBSP (*1) analyses are possible at optimized analytical geometry. The specimen stage has a wide traverse range for observation of sample areas up to 203mm diameter and up to 110mm height with EDX and WDX analysis.
    Documents

    No documents

    HITACHI

    S-3700N

    verified-listing-icon

    Verified

    CATEGORY

    SEM
    Last Verified: Over 30 days ago
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    87020

    Wafer Sizes:

    Unknown

    Vintage:

    2011

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    HITACHI S-3700N
    HITACHIS-3700NSEM
    Vintage: 2012Condition: Used
    Last Verified23 days ago
    HITACHI S-3700N
    HITACHIS-3700NSEM
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago
    HITACHI S-3700N
    HITACHIS-3700NSEM
    Vintage: 2011Condition: Used
    Last VerifiedOver 30 days ago

    HITACHI

    S-3700N

    verified-listing-icon

    Verified

    CATEGORY

    SEM
    Last Verified: Over 30 days ago
    listing-photo-1ac1096271f7451086f753708a0a8986-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2046/1ac1096271f7451086f753708a0a8986/b25f9eb4a9fc4d4a87c58be9a3c4c8c0_1e7658cc7a424dafbf8044f65888d3a41201a_mw.jpeg
    listing-photo-1ac1096271f7451086f753708a0a8986-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2046/1ac1096271f7451086f753708a0a8986/c9ede0e6db26406883a4d188d55bc2f4_4e0690e9a5a441909222477700e5635d_mw.jpeg
    listing-photo-1ac1096271f7451086f753708a0a8986-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2046/1ac1096271f7451086f753708a0a8986/59a97cbef0b84562b0a3da4b33e781ad_9f63efebf59849d2a6e32d0f4cecaf86_mw.jpeg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    87020

    Wafer Sizes:

    Unknown

    Vintage:

    2011

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    - EDS: Yes EDAX/ Model: Apollo XP Detectors: - Everhart thornley secondary electron detector - High sensitivity semiconductor BSE detector OS：SEM/Windows 7, EDX/Windows7 Accessories: Carbon Coater (VC-100)
    OEM Model Description
    S-3700N is designed as a new series of Tungsten-type VP-SEM to accommodate sample diameters up to 300mm using a new large specimen chamber and a large specimen stage. Moreover, simultaneous accommodations of accessory attachments for EDX, WDX and EBSP (*1) analyses are possible at optimized analytical geometry. The specimen stage has a wide traverse range for observation of sample areas up to 203mm diameter and up to 110mm height with EDX and WDX analysis.
    Documents

    No documents

    Similar Listings
    View All
    HITACHI S-3700N
    HITACHI
    S-3700N
    SEMVintage: 2012Condition: UsedLast Verified: 23 days ago
    HITACHI S-3700N
    HITACHI
    S-3700N
    SEMVintage: 0Condition: UsedLast Verified: Over 60 days ago
    HITACHI S-3700N
    HITACHI
    S-3700N
    SEMVintage: 2011Condition: UsedLast Verified: Over 30 days ago