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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL50
    Description
    No description
    Configuration
    Scanning Electron Microscope (SEM FEI XL50 Large sample chamber w/ load lock Capable to navigate full 8” wafer. Stage platen to hold full wafer Stage platen for multi stub analysis System is installed and operational Noran EDS detector
    OEM Model Description
    Scanning Electron Microscope
    Documents

    No documents

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL50

    verified-listing-icon

    Verified

    CATEGORY
    SEM

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Installed / Running

    Product ID:

    106592

    Wafer Sizes:

    8"/200mm

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL50

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL50

    SEM
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL50

    verified-listing-icon
    Verified
    CATEGORY
    SEM
    Last Verified: Over 60 days ago
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/38dae80b71814bf38a53fc90587c4001_236677b67b9a49f496b86efa74f8c8a61201a_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/182dd0818a3c4f1ebcd2984df58fadad_4039d73b2f624fc38421d284403382061201a_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/f19cd4d7032b42afa4f4ca49ca31ac5e_e6751da9a7a440adba2a12ad59206d69_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/50d72f683ea34c459c3d7ca97e79b32b_984fc513ced24c68b8b4b97e2c0ca1dc_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/ff5806e127714b8a96b87b5df596e3b1_59947b8bf1cf4383a1e7bb42846a4d65_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/7a4ea99a073e479fa132a4e522459d03_c8c06cebf72d4a519cb388abe2986a9b_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/e0b80c59da634d99822f2da87afdcc1f_457737e8432b4a829c675216985da2c4_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/8b82e9f60e984966b66013297f2ea9b2_c32f68d622e34971aa078c1f85f9f2521201a_mw.jpeg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Installed / Running

    Product ID:

    106592

    Wafer Sizes:

    8"/200mm

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    Scanning Electron Microscope (SEM FEI XL50 Large sample chamber w/ load lock Capable to navigate full 8” wafer. Stage platen to hold full wafer Stage platen for multi stub analysis System is installed and operational Noran EDS detector
    OEM Model Description
    Scanning Electron Microscope
    Documents

    No documents

    Similar Listings
    View All
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL50

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL50

    SEMVintage: 0Condition: UsedLast Verified:Over 60 days ago