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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL830
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    OEM Model Description
    The FEI XL830 is a DualBeam FIB/SEM system that offers high-resolution SEM imaging and quick, accurate ion milling. The SEM column of the DualBeam XL830 workstation delivers 3-nm resolution within the range of 1-30 kV, while the electron column features balanced-field, in-lens detection that provides detailed topographical information, improved visibility down holes, and enhanced imaging of grain boundaries.
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    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL830

    verified-listing-icon

    Verified

    CATEGORY

    SEM
    Last Verified: Over 60 days ago
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    30669

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

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    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL830
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPSXL830SEM
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL830

    verified-listing-icon

    Verified

    CATEGORY

    SEM
    Last Verified: Over 60 days ago
    listing-photo-21b0404c395e4c6cb340891ae3cd0920-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/44191/21b0404c395e4c6cb340891ae3cd0920/a9ece459302f4f4a9d9fe49bb739dfc2_3c6c4219291b4a85b2e3ec40a2d99e771201a_mw.jpeg
    listing-photo-21b0404c395e4c6cb340891ae3cd0920-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/44191/21b0404c395e4c6cb340891ae3cd0920/f5cc3f6d64e848ebbac6e9b6156d8011_3c168eac3d7345e2b2f2bd7378b4785b1201a_mw.jpeg
    listing-photo-21b0404c395e4c6cb340891ae3cd0920-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/44191/21b0404c395e4c6cb340891ae3cd0920/0a761968da0347c19ed6dbdb29e2c382_73add5f7d18a49ae9777763c585d81111201a_mw.jpeg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    30669

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The FEI XL830 is a DualBeam FIB/SEM system that offers high-resolution SEM imaging and quick, accurate ion milling. The SEM column of the DualBeam XL830 workstation delivers 3-nm resolution within the range of 1-30 kV, while the electron column features balanced-field, in-lens detection that provides detailed topographical information, improved visibility down holes, and enhanced imaging of grain boundaries.
    Documents

    No documents

    Similar Listings
    View All
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL830
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
    XL830
    SEMVintage: 0Condition: UsedLast Verified: Over 60 days ago