Skip to main content
We value your privacy

We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. Read More

Moov logo

Moov Icon

XL30 TMP

Category
SEM / FIB
Overview

The FEI (Philips) XL30 TMP is a traditional scanning electron microscope (SEM) from the XL Series that is versatile and suitable for a wide range of applications. It delivers exceptional performance for both imaging and micro-analysis of conductive and/or coated samples, making it ideal for specialized research in metallography as well as routine tasks such as monitoring manufacturing processes. The XL30 TMP has an electron optical column with a conical final lens and a fixed final lens aperture, which is designed for high-resolution imaging, X-ray microanalysis, and low magnification performance. The system also features extensive automation and user-friendly software control, making it an excellent tool for both novice and experienced users.

Active Listings

0

Services

Inspection, Insurance, Appraisal, Logistics

Top Listings

    No products found
Have one like this?
List it with Moov and find the perfect buyer in no time at all.