We value your privacy
We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. Read More
We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. Read More
The FEI Strata 400 STEM is a type of DualBeam™ system that combines the capabilities of a field emission scanning electron microscope (SEM) column with those of a focused ion beam (FIB) column to provide high-resolution, high-contrast imaging and specimen preparation. This system features complete in-situ sample preparation capabilities and high-resolution imaging, allowing TEM samples to be prepared without breaking vacuum. The Strata 400 STEM is specifically designed to meet the growing demand for high-resolution analytical capabilities as device geometries shrink below 100 nm and new materials are introduced. It includes integrated sample lift-out and handling, as well as SEM-STEM (scanning transmission electron microscopy) imaging, enabling high-contrast, high-resolution analysis.
0
Inspection, Insurance, Appraisal, Logistics