Description
Working Condition No missing partsConfiguration
- Spatial Resolution: 3-4 nm under optimal conditions - Accelerating Voltages from 0.5 kV - 30 kV - Everhart Thornley Detector (for SE) - Solid-State BSED for high vacuum - In Lens SE (TLD SE) and BSE (TLD BSE) detectors - Gatan Chroma CL Detector for wavelength 400-800 nm - EDS X-ray mapping (dual Bruker 30 mm2 detectors) - Low Vacuum Capability (< 0.1 Torr) using UHR low vacuum SED (Helix Detector) and low vacuum SED (LVD) - Deceleration Mode allows to work at accelerating voltage of 2kV - IR-CCD camera for in-chamber viewing - 5-Axes motorized stage (X-Y-Z-Tilt-Rotation) - Working distance 5mm - 13mm - Beam current of up to 10 nA in High-Resolution Mode and up to 22 nA in - Analytical ModeOEM Model Description
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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS
NOVA NANOSEM 430
Verified
CATEGORY
SEM
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
82913
Wafer Sizes:
Unknown
Vintage:
2009
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Money Back Guarantee
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Transaction Insured by Moov
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Refurbishment Services
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View AllTHERMOFISHER SCIENTIFIC / FEI / PHILLIPS
NOVA NANOSEM 430
Verified
CATEGORY
SEM
Last Verified: Over 30 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
82913
Wafer Sizes:
Unknown
Vintage:
2009
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Working Condition No missing partsConfiguration
- Spatial Resolution: 3-4 nm under optimal conditions - Accelerating Voltages from 0.5 kV - 30 kV - Everhart Thornley Detector (for SE) - Solid-State BSED for high vacuum - In Lens SE (TLD SE) and BSE (TLD BSE) detectors - Gatan Chroma CL Detector for wavelength 400-800 nm - EDS X-ray mapping (dual Bruker 30 mm2 detectors) - Low Vacuum Capability (< 0.1 Torr) using UHR low vacuum SED (Helix Detector) and low vacuum SED (LVD) - Deceleration Mode allows to work at accelerating voltage of 2kV - IR-CCD camera for in-chamber viewing - 5-Axes motorized stage (X-Y-Z-Tilt-Rotation) - Working distance 5mm - 13mm - Beam current of up to 10 nA in High-Resolution Mode and up to 22 nA in - Analytical ModeOEM Model Description
None ProvidedDocuments
No documents